Correlating the Density of Trap-States and the Field-Effect Performance in Metal-Oxide Thin-Film Transistors with High-κ Gate Dielectrics via a Trap-Limited Conduction Method

Mochamad Januar, Chun Wen Cheng, Wen Kai Lin, Vito Vito, Meng Chyi Wu, Shu Tong Chang, Kou Chen Liu*

*Corresponding author for this work

Research output: Contribution to journal › Journal Article › peer-review

4 Scopus citations

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