Corrigendum to “Low-damage NH3 plasma treatment on SiO2 tunneling oxide of chemically-synthesized gold nanoparticle nonvolatile memory” [Curr. Appl. Phys. (2016) 16(5) (605−610)] (S1567173916300487)(10.1016/j.cap.2016.03.009)

Jer Chyi Wang*, Kai Ping Chang, Chin Hsiang Liao, Ruey Dar Chang, Chao Sung Lai, Li Chun Chang

*Corresponding author for this work

Research output: Contribution to journalComment/debate

Abstract

The authors regret for the erroneous affiliations of Chao-Sung Lai: Chao-Sung Lai a, c a Department of Electronic Engineering, Chang Gung University, Guishan Dist., 33302, Taoyuan, Taiwan c Center for Reliability Sciences & Technologies (CREST), Chang Gung University, Guishan Dist., 33302, Taoyuan, Taiwan It should be as follows: Chao-Sung Lai a, c, e a Department of Electronic Engineering, Chang Gung University, Guishan Dist., 33302, Taoyuan, Taiwan c Center for Reliability Sciences & Technologies (CREST), Chang Gung University, Guishan Dist., 33302, Taoyuan, Taiwan e Department of Nephrology, Chang Gung Memorial Hospital, Guishan Dist. 33305, Taoyuan, Taiwan The authors would like to apologise for any inconvenience caused.

Original languageEnglish
Pages (from-to)592
Number of pages1
JournalCurrent Applied Physics
Volume17
Issue number4
DOIs
StatePublished - 01 04 2017

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© 2017 Elsevier B.V.

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