Abstract
Crowd counting has recently attracted significant attention in the field of computer vision due to its wide applications to image understanding. Numerous methods have been proposed and achieved state-of-the-art performance for real-world tasks. However, existing approaches do not perform well under adverse weather such as haze, rain, and snow since the visual appearances of crowds in such scenes are drastically different from those images in clear weather of typical datasets. In this paper, we propose a method for robust crowd counting in adverse weather scenarios. Instead of using a two-stage approach that involves image restoration and crowd counting modules, our model learns effective features and adaptive queries to account for large appearance variations. With these weather queries, the proposed model can learn the weather information according to the degradation of the input image and optimize with the crowd counting module simultaneously. Experimental results show that the proposed algorithm is effective in counting crowds under different weather types on benchmark datasets. The source code is available in our project page.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 23251-23262 |
| Number of pages | 12 |
| ISBN (Electronic) | 9798350307184 |
| DOIs | |
| State | Published - 2023 |
| Externally published | Yes |
| Event | 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Paris, France Duration: 02 10 2023 → 06 10 2023 |
Publication series
| Name | Proceedings of the IEEE International Conference on Computer Vision |
|---|---|
| ISSN (Print) | 1550-5499 |
Conference
| Conference | 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 |
|---|---|
| Country/Territory | France |
| City | Paris |
| Period | 02/10/23 → 06/10/23 |
Bibliographical note
Publisher Copyright:© 2023 IEEE.
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