Abstract
A GaN/AlGaN two-dimensional electron system (2DES) has been prepared on a Si substrate, and the electron heating effect in the 2DES has been studied experimentally by using the resistance of the 2DES as a self-thermometer. The relation Te ∼ I1. 42 was obtained, which is in contrast to Te ∼ I0.5 in the spin-split resistivity peaks in a GaAs/AlGaAs 2DES. A possible reason for this is discussed.
Original language | English |
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Pages (from-to) | 1666-1669 |
Number of pages | 4 |
Journal | Journal of the Korean Physical Society |
Volume | 50 |
Issue number | 6 |
DOIs | |
State | Published - 06 2007 |
Keywords
- CMOS
- Current scaling
- Electron heating
- GaN
- Si
- Two-dimensional electron system