Damage of light-emitting diodes induced by high reverse-bias stress

Research output: Contribution to conference › Proceeding

Original language	American English
State	Published - 2008
Event	The 4th Asian Conference on Crystal Growth and Crystal Technology - Sendai, Japan Duration: 21 05 2008 → 24 05 2008

Conference	The 4th Asian Conference on Crystal Growth and Crystal Technology
Period	21/05/08 → 24/05/08

Cite this

@conference{d9b8a516f59b4a009a62295816b6942e,

title = "Damage of light-emitting diodes induced by high reverse-bias stress",

author = "Y.N. Wang and Y.S. Wang and W.C. Lien and Y.C. Chen and Nai-Chuan Chen",

year = "2008",

language = "American English",

note = "The 4th Asian Conference on Crystal Growth and Crystal Technology ; Conference date: 21-05-2008 Through 24-05-2008",

}