DC and RF characteristics of E-mode Ga0.51In0.49P-In0.15Ga0.85As pseudomorphic HEMTs

Hsing Yuan Tu, Tao Hsuan Chou, Yo Sheng Lin, Hsien Chin Chiu, Ping Yu Chen, Wen Chung Wu, Shey Shi Lu*

*Corresponding author for this work

Research output: Contribution to journalJournal Letter peer-review

13 Scopus citations

Abstract

The dc and RF characteristics of Ga0.49In0.51 P-In0.15Ga0.85As enhancement-mode pseudomorphic HEMTs (pHEMTs) are reported for the first time. The transistor has a gate length of 0.8 μm and a gate width of 200 μm. It is found that the device can be operated with gate voltage up to 1.6 V, which corresponds to a high drain-source current (IDS) of 340 mA/mm when the drain-source voltage (VDS) is 4.0 V. The measured maximum transconductance, current gain cut-off frequency, and maximum oscillation frequency are 255.2 mS/mm, 20.6 GHz, and 40 GHz, respectively. When this device is operated at 1.9 GHz under class-AB bias condition, a 14.7-dBm (148.6 mW/mm) saturated power with a power-added efficiency of 50% is achieved when the drain voltage is 3.5 V. The measured Fmin is 0.74 dB under IDS = 15 mA and VDS = 2 V.

Original languageEnglish
Pages (from-to)132-134
Number of pages3
JournalIEEE Electron Device Letters
Volume24
Issue number3
DOIs
StatePublished - 03 2003
Externally publishedYes

Keywords

  • Enhancement mode
  • GaInP
  • Pseudomorphic HEMT (pHEMT)
  • Single-positive-voltage supply

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