Design and evaluation of fault-tolerant interleaved memory systems

Shyue Kung Lu*, Sy Yen Kuo, Cheng Wen Wu

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

A highly reliable interleaved memory system for uniprocessor and multiprocessor computer architectures is presented. The memory system is divided into groups. Each group consists of several banks and furthermore, each bank has several memory units. Spare memory units as well as spare banks are incorporated in the system to enhance reliability. Reliability figures are derived to evaluate systems with various amounts of redundancy. The result shows that the system reliability can be significantly improved with little hardware overhead. User transparency in memory access is retained.

Original languageEnglish
Pages (from-to)354-359
Number of pages6
JournalProceedings of the Asian Test Symposium
StatePublished - 1994
Externally publishedYes
EventProceedings of the 3rd Asian Test Symposium - Nara, Jpn
Duration: 15 11 199417 11 1994

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