Design of Reliable VLSI Circuits Using Simulation Techniques

Wen Jay Hsu, Bing J. Sheu, Sudhir M. Gowda

Research output: Contribution to journalJournal Article peer-review

14 Scopus citations

Abstract

Reliable VLSI circuits are crucial building blocks of high-quality electronic systems. An iterative simulation method of predicting the impact of progressive device degradation on circuit performance due to common microelectronic failure mechanisms is described. Hot-carrier effects on submicrometer digital and analog circuits are used to demonstrate the approach. Experimental results on precharging circuitry for sense amplifiers and operational amplifiers are presented.

Original languageEnglish
Pages (from-to)452-457
Number of pages6
JournalIEEE Journal of Solid-State Circuits
Volume26
Issue number3
DOIs
StatePublished - 03 1991
Externally publishedYes

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