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Double-atomic layer of Tl on Si(111): Atomic arrangement and electronic properties

  • Alexey N. Mihalyuk
  • , Leonid V. Bondarenko
  • , Alexandra Y. Tupchaya
  • , Dimitry V. Gruznev
  • , Jyh Pin Chou
  • , Cheng Rong Hsing
  • , Ching Ming Wei
  • , Andrey V. Zotov
  • , Alexander A. Saranin*
  • *Corresponding author for this work
  • Far Eastern Federal University
  • RAS - Institute for Automation and Control Processes, Far Eastern Branch
  • Wigner Research Centre for Physics
  • Academia Sinica Taiwan HQ

Research output: Contribution to journalJournal Article peer-review

11 Scopus citations

Abstract

Metastable double-atomic layer of Tl on Si(111) has recently been found to display interesting electric properties, namely superconductivity below 0.96 K and magnetic-field-induced transition into an insulating phase intermediated by a quantum metal state. In the present work, using a set of experimental techniques, including low-energy electron diffraction, scanning tunneling microscopy, angle-resolved photoelectron spectroscopy, in a combination with density-functional-theory calculations, we have characterized atomic and electronic properties of the Tl double layer on Si(111). The double Tl layer has been concluded to contain ∼ 2.4 monolayer of Tl. A top Tl layer has a ‘1 × 1’ basic structure and displays 6 × 6 moiré pattern which originates from various residence sites of Tl atoms. Upon cooling below ∼ 140 K, the 6 × 6 moiré pattern changes to that having a 63×63 periodicity. However, the experimentally determined electron band dispersions show a 1 × 1 periodicity. The calculated band structure unfolded into the 1 × 1 surface Brillouin zone reproduces well the main features of the photoelectron spectra.

Original languageEnglish
Pages (from-to)17-22
Number of pages6
JournalSurface Science
Volume668
DOIs
StatePublished - 02 2018
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2017 Elsevier B.V.

Keywords

  • Angle-resolved photoelectron spectroscopy
  • Atom–solid interactions
  • First-principal calculations
  • Scanning tunneling microscopy
  • Silicon
  • Thallium

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