Editorial

Juin J. Liou^*, Chao Sung Lai

^*Corresponding author for this work

Research output: Contribution to journal › Journal Editorial

Original language	English
Pages (from-to)	583
Number of pages	1
Journal	Microelectronics Reliability
Volume	50
Issue number	5
DOIs	https://doi.org/10.1016/j.microrel.2010.02.010
State	Published - 05 2010

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title = "Editorial",

author = "Liou, {Juin J.} and Lai, {Chao Sung}",

year = "2010",

month = may,

doi = "10.1016/j.microrel.2010.02.010",

language = "英语",

volume = "50",

pages = "583",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

number = "5",

}

TY - JOUR

T1 - Editorial

AU - Liou, Juin J.

AU - Lai, Chao Sung

PY - 2010/5

Y1 - 2010/5

UR - http://www.scopus.com/inward/record.url?scp=77953209626&partnerID=8YFLogxK

U2 - 10.1016/j.microrel.2010.02.010

DO - 10.1016/j.microrel.2010.02.010

M3 - 社论

AN - SCOPUS:77953209626

SN - 0026-2714

VL - 50

SP - 583

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 5

ER -