| Original language | English |
|---|---|
| Pages (from-to) | 583 |
| Number of pages | 1 |
| Journal | Microelectronics Reliability |
| Volume | 50 |
| Issue number | 5 |
| DOIs | |
| State | Published - 05 2010 |
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Editorial
- Juin J. Liou*
- , Chao Sung Lai
*Corresponding author for this work
Research output: Contribution to journal › Journal Editorial