Editorial

Asen Asenov, Ulf Schichtmann, Cher Ming Tan, Hei Wong, Xing Zhou

Research output: Contribution to journal › Journal Editorial

Original language	English
Pages (from-to)	1-2
Number of pages	2
Journal	Microelectronics Reliability
Volume	61
DOIs	https://doi.org/10.1016/j.microrel.2016.03.028
State	Published - 01 06 2016

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title = "Editorial",

author = "Asen Asenov and Ulf Schichtmann and Tan, {Cher Ming} and Hei Wong and Xing Zhou",

year = "2016",

month = jun,

day = "1",

doi = "10.1016/j.microrel.2016.03.028",

language = "英语",

volume = "61",

pages = "1--2",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

}

TY - JOUR

T1 - Editorial

AU - Asenov, Asen

AU - Schichtmann, Ulf

AU - Tan, Cher Ming

AU - Wong, Hei

AU - Zhou, Xing

PY - 2016/6/1

Y1 - 2016/6/1

UR - http://www.scopus.com/inward/record.url?scp=84963579165&partnerID=8YFLogxK

U2 - 10.1016/j.microrel.2016.03.028

DO - 10.1016/j.microrel.2016.03.028

M3 - 社论

AN - SCOPUS:84963579165

SN - 0026-2714

VL - 61

SP - 1

EP - 2

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -