Editorial for Special Issue on Reliability Analysis Electrotechnical Devices

^*Corresponding author for this work

Research output: Contribution to journal › Journal Editorial

2 Scopus citations

Original language	English
Article number	4086
Journal	Applied Sciences (Switzerland)
Volume	12
Issue number	8
DOIs	https://doi.org/10.3390/app12084086
State	Published - 01 04 2022

Access to Document

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title = "Editorial for Special Issue on Reliability Analysis Electrotechnical Devices",

author = "Tan, \{Cher Ming\}",

year = "2022",

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doi = "10.3390/app12084086",

language = "英语",

volume = "12",

journal = "Applied Sciences (Switzerland)",

issn = "2076-3417",

publisher = "Multidisciplinary Digital Publishing Institute (MDPI)",

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T1 - Editorial for Special Issue on Reliability Analysis Electrotechnical Devices

AU - Tan, Cher Ming

PY - 2022/4/1

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U2 - 10.3390/app12084086

DO - 10.3390/app12084086

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