Effect of annealing on the structural and optical properties of AgGaS2 thin films prepared by pulsed laser deposition

  • Hsu Cheng Hsu
  • , Hsin Hong Chen
  • , Shou Yi Kuo
  • , Chen Shiung Chang
  • , Wen Feng Hsieh*
  • *Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

13 Scopus citations

Abstract

The influence of annealing on the AgGaS2 films grown by pulsed laser deposition has been investigated. The X-ray diffraction results show the AgGaS2 films were found with preferential orientation (1 1 2) normal to the surface and silver droplets were diminished after the post-annealing. Photoluminescence (PL) measurements reveled the exciton energy is slightly red shifted that is possibly due to the thermal strain effect. The binding energy of the shallow donors is ∼28 meV determined from temperature dependent PL spectra. In addition, the A-exciton and the B/C-exciton could be observed in the transmittance spectra at room temperature.

Original languageEnglish
Pages (from-to)237-241
Number of pages5
JournalThin Solid Films
Volume419
Issue number1-2
DOIs
StatePublished - 01 11 2002
Externally publishedYes

Keywords

  • Optical properties
  • Photoluminescence
  • X-ray diffraction

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