Abstract
The influence of annealing on the AgGaS2 films grown by pulsed laser deposition has been investigated. The X-ray diffraction results show the AgGaS2 films were found with preferential orientation (1 1 2) normal to the surface and silver droplets were diminished after the post-annealing. Photoluminescence (PL) measurements reveled the exciton energy is slightly red shifted that is possibly due to the thermal strain effect. The binding energy of the shallow donors is ∼28 meV determined from temperature dependent PL spectra. In addition, the A-exciton and the B/C-exciton could be observed in the transmittance spectra at room temperature.
| Original language | English |
|---|---|
| Pages (from-to) | 237-241 |
| Number of pages | 5 |
| Journal | Thin Solid Films |
| Volume | 419 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 01 11 2002 |
| Externally published | Yes |
Keywords
- Optical properties
- Photoluminescence
- X-ray diffraction
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