TY - JOUR
T1 - Effective design-for-testability techniques for H.264 all-binary integer motion estimation
AU - Yeh, P. Y.
AU - Ye, B. Y.
AU - Kuo, S. Y.
AU - Chen, I. Y.
PY - 2010/9
Y1 - 2010/9
N2 - H.264 is the latest video compression standard with the highest coding efficiency, and the All-Binary Integer Motion Estimation algorithm (H.264-ABIME) is usually adopted for reducing the hardware area. There are many repeated modules in the H.264-ABIME block, thus the well-known Iterative-Logic-Array (ILA) architecture can be applied to test all the modules with constant number of test patterns. The most important condition for the ILA architecture is that the I/O function of each module should be bijective (reversible). However, most of the original designs do not have this property. In this paper, effective design-for-testability schemes are proposed by using the ILA architecture for the entire H.264-ABIME block. The repeated modules are modified to be bijective and cascaded as the ILA architecture. Then each module can be fully tested by only testing the first module exhaustively. A simple built-in self-test circuit is also proposed. Moreover, the physical designs of the scan-chain and the proposed test schemes are synthesised with the UMC 0.18 μm technology. The total test time of the proposed method is only about 13.53% of that of scan-chain method with automatic test pattern generation (ATPG), and the hardware and delay-time overheads are still very low.
AB - H.264 is the latest video compression standard with the highest coding efficiency, and the All-Binary Integer Motion Estimation algorithm (H.264-ABIME) is usually adopted for reducing the hardware area. There are many repeated modules in the H.264-ABIME block, thus the well-known Iterative-Logic-Array (ILA) architecture can be applied to test all the modules with constant number of test patterns. The most important condition for the ILA architecture is that the I/O function of each module should be bijective (reversible). However, most of the original designs do not have this property. In this paper, effective design-for-testability schemes are proposed by using the ILA architecture for the entire H.264-ABIME block. The repeated modules are modified to be bijective and cascaded as the ILA architecture. Then each module can be fully tested by only testing the first module exhaustively. A simple built-in self-test circuit is also proposed. Moreover, the physical designs of the scan-chain and the proposed test schemes are synthesised with the UMC 0.18 μm technology. The total test time of the proposed method is only about 13.53% of that of scan-chain method with automatic test pattern generation (ATPG), and the hardware and delay-time overheads are still very low.
UR - http://www.scopus.com/inward/record.url?scp=77956640298&partnerID=8YFLogxK
U2 - 10.1049/iet-cds.2009.0353
DO - 10.1049/iet-cds.2009.0353
M3 - 文章
AN - SCOPUS:77956640298
SN - 1751-858X
VL - 4
SP - 403
EP - 413
JO - IET Circuits, Devices and Systems
JF - IET Circuits, Devices and Systems
IS - 5
M1 - ICDSB4000004000005000403000001
ER -