Abstract
The effect of surface passivation using (NH4)2 S and (NH4)2 S/ P2S5 on a AlGaN/GaN-based metal-semiconductor-metal diode above a two-dimensional electron gas (MSM-2DEG) varactor was investigated. The surface property, capacitance ratio (Cmax / Cmin), and leakage current of the prepared samples were studied before and after treatments using X-ray photoelectron spectroscopy and capacitance-voltage and current-voltage analyses. It showed that the (NH4)2 S/ P2S5 -treated sample had the most excellent surface state and Cmax / Cmin and the least leakage current because of either reduced native oxide or deposited phosphorus compounds only provided by (NH4) 2 S/ P2S5 and sulfide upon the surface, also validated by having the highest sheet carrier density. Hence, these promising results promote further potential for varactor applications.
Original language | English |
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Pages (from-to) | H350-H353 |
Journal | Electrochemical and Solid-State Letters |
Volume | 13 |
Issue number | 10 |
DOIs | |
State | Published - 2010 |