Efficiency Droop and Degradation in AlGaN-Based UVB Light-Emitting Diodes

Yi Tsung Chang, Mu Jen Lai*, Rui Sen Liu, Shu Chang Wang, Xiong Zhang, Lin Jun Zhang, Yu Hsien Lin, Shiang Fu Huang, Lung Chien Chen, Ray Ming Lin*

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

3 Scopus citations

Abstract

In this study, we found that the current droop (J-droop) in AlGaN-based UVB light-emitting diodes was more obvious at higher temperatures, despite both the main and parasitic peaks undergoing monotonic decreases in their intensity upon an increase in the temperature. The slower temperature droop (T-droop) did not occur when the forward current was increased to temperatures greater than 298 K. After an aging time of 6000 h, the emission wavelengths did not undergo any obvious changes, while the intensity of the parasitic peak barely changed. Thus, the degradation in the light output power during long-term operation was not obviously correlated to the existence of the parasitic peak.

Original languageEnglish
Article number1082
JournalCrystals
Volume12
Issue number8
DOIs
StatePublished - 08 2022

Bibliographical note

Publisher Copyright:
© 2022 by the authors.

Keywords

  • AlGaN
  • current droop
  • external quantum efficiency
  • light-emitting diodes
  • temperature droop
  • ultraviolet-B

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