Efficient job-release plan development for semiconductor assembly and testing in GA

Kung Jeng Wang, Chun Chih Chiu, Dah Chuan Gong*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Taiwan's semiconductor integrated circuit (IC) industry plays an important role in the world and has maintained a major market share, especially, in the business of IC's packaging and testing. In the past, many studies have discussed job-release models for upstream IC manufacturing, but few emphasize on the IC turnkey factory, which including IC assembly and testing operations. In this paper, a job-release strategy for an IC turnkey factory with known assembly cycle time will be proposed. Concerning objectives under limited-capacity resources are (1) increasing the overall equipment efficiency (OEE) of IC test equipments, (2) reducing the fabrication cycle time, and (3) increasing the on-time delivery (OTD) rate. A genetic algorithm (GA) is applied to obtain an efficient job-release plan based on the data of an IC turnkey factory in Taiwan.

Original languageEnglish
Title of host publication2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010
Pages1205-1210
Number of pages6
DOIs
StatePublished - 2010
Externally publishedYes
Event2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010 - Qingdao, China
Duration: 11 07 201014 07 2010

Publication series

Name2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010
Volume3

Conference

Conference2010 International Conference on Machine Learning and Cybernetics, ICMLC 2010
Country/TerritoryChina
CityQingdao
Period11/07/1014/07/10

Keywords

  • Genetic algorithm
  • IC testing
  • IC turnkey factory
  • Job-release

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