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Electromigration in ULSI interconnects
Cher Ming Tan
*
, Arijit Roy
*
Corresponding author for this work
Nanyang Technological University
Research output
:
Contribution to journal
›
Review article
›
peer-review
244
Scopus citations
Overview
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Computer Science
Interconnection
100%
Testing
66%
Modeling
33%
Design
33%
Data Analysis
33%
Identification
33%
Operating Condition
33%
Statistical Analysis
33%
Linewidth
33%
Chemistry
Force
100%
Concentration
50%
Analytical Method
50%
Procedure
25%
Electron Particle
25%
Diffusion
25%
Linewidth
25%
Physics
Electromigration
100%
Diffusivity
6%
Revisions
6%
Assessments
6%
Physics
6%
Reliability
6%
Electrons
6%
Statistical Analysis
6%
Wafer
6%
Work
6%
Data Transmission
6%
Material Science
Electromigration
100%
Shrinkage
6%