Electromigration modeling at circuit layout level

Cher-Ming Tan

Department of Electronic Engineering

Research output: Book/Report › Book

Original language	American English
Place of Publication	Singapore
Publisher	Springer
ISBN (Print)	9789814451208, 9814451207
State	Published - 2013

Other files and links

http://web20.lib.cgu.edu.tw/webpac/refid/005373134

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