Abstract
A statistical model for the calculation of inelastic mean free paths and energy losses of electrons in solids is described. Results for the application of the model to the six solid media Al, Au, Ag, Cu, Ni, and Si are presented. Agreement between calculated mean free paths and experimental attenuation lengths indicates that the statistical model provides a useful method in the little-studied electron energy range from a few tens of electron volts to 10 keV.
Original language | English |
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Pages (from-to) | 427-439 |
Number of pages | 13 |
Journal | Surface Science |
Volume | 81 |
Issue number | 2 |
DOIs | |
State | Published - 01 03 1979 |
Externally published | Yes |