Empirical model of Si3N4 erosion in the direct STI CMP process for advanced nanometer generation

Chi Hsiang Kuo, Shing Yih Shih, Chien Mao Liao, Chang Rang Wu, Jeng Ping Lin, Pei Ing Lee

Research output: Contribution to conferenceConference Paperpeer-review

Fingerprint

Dive into the research topics of 'Empirical model of Si3N4 erosion in the direct STI CMP process for advanced nanometer generation'. Together they form a unique fingerprint.

Material Science

Engineering