TY - JOUR
T1 - Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test
AU - Chen, Sihan Joseph
AU - Tan, Cher Ming
AU - Chen, Boon Khai Eric
AU - Chua, Zhi Yong Shaun
PY - 2012/8
Y1 - 2012/8
N2 - In order to accurately estimate the lifetime of Light Emitting Diodes (LEDs), accelerated stress tests have to be performed, and measurements done throughout the tests should be free of artifact and repeatable to ensure accurate observations of the degradation of the LEDs. In this work, measurements artifact arising from DC biasing and PWM settings were first presented. Electrical measurements consistency was then studied. Optimized setting for accurate measurement is obtained using Response Surface Method with Central Composite Design, and the setting is verified through experiments.
AB - In order to accurately estimate the lifetime of Light Emitting Diodes (LEDs), accelerated stress tests have to be performed, and measurements done throughout the tests should be free of artifact and repeatable to ensure accurate observations of the degradation of the LEDs. In this work, measurements artifact arising from DC biasing and PWM settings were first presented. Electrical measurements consistency was then studied. Optimized setting for accurate measurement is obtained using Response Surface Method with Central Composite Design, and the setting is verified through experiments.
UR - https://www.scopus.com/pages/publications/84863724994
U2 - 10.1016/j.microrel.2011.08.020
DO - 10.1016/j.microrel.2011.08.020
M3 - 文章
AN - SCOPUS:84863724994
SN - 0026-2714
VL - 52
SP - 1632
EP - 1635
JO - Microelectronics Reliability
JF - Microelectronics Reliability
IS - 8
ER -