Evaluation of planar tomography using large area planar positron imaging system

Y. C. Ni, M. L. Jan*, T. Yamashita, T. Okamoto, H. Kume, Sammy Chen, N. Tsurumi

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Thin study is to evaluate performances of a large area planar positron imaging system (PPIS-4800, Hamamatsu) using planar tomography reconstruction. The oblique angles of lines of response, which influence the imaging performances, vary with the detector-to-detector distance. In this study, distances between detectors were set to 300, 200, 120 mm for evaluating the spatial resolutions and the noise characteristics. The results show that the spatial resolutions are 1.9 mm (X), 1.7 mm (Y), and 12.7 mm (Z) at detector distance 300 mm. Because of the incomplete angles of lines of response for the stationary dual-plane geometry, the resolution in Z direction is much poorer than in X, Y directions. As the detector distance reduced to 200 mm and 120 mm the Z-direction resolutions were improved to 10.2 and 9.0 mm, respectively. However, the resolutions of X direction were degraded to 1.87 and 1.86 mm. The resolutions of Y were degraded to 2.36 and 2.37 mm. As for the image quality, the noise characteristics of 3D planar tomography are comparable to that of 2D planar image, although the total counts were dispersed to more voxels for planar tomography. Phantom images were shown to present detection ability of the PPIS-4800 with planar tomography reconstruction.

Original languageEnglish
Title of host publication2006 IEEE Nuclear Science Symposium - Conference Record
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1893-1895
Number of pages3
ISBN (Print)1424405610, 9781424405619
DOIs
StatePublished - 2006
Externally publishedYes
Event2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD - San Diego, CA, United States
Duration: 29 10 200604 11 2006

Publication series

NameIEEE Nuclear Science Symposium Conference Record
Volume3
ISSN (Print)1095-7863

Conference

Conference2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD
Country/TerritoryUnited States
CitySan Diego, CA
Period29/10/0604/11/06

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