Evaluation of spatial Green's functions for microstrips: Fast Hankel transform algorithm and complex image method

Rong Chan Hsieh; Jen Tsai Kuo

doi:10.1049/el:19980787

Evaluation of spatial Green's functions for microstrips: Fast Hankel transform algorithm and complex image method

Rong Chan Hsieh^*
, Jen Tsai Kuo

^*Corresponding author for this work

National Yang Ming Chiao Tung University

Research output: Contribution to journal › Review article › peer-review

3 Scopus citations

Abstract

The fast Hankel transform (FHT) algorithm and complex image method (CIM) are employed to evaluate the spatial-domain Green's function for a multilayered microstrip structure. The results are compared with those obtained by exact numerical integration. It is found that both techniques have high efficiency and the FHT has better accuracy than the CIM.

Original language	English
Pages (from-to)	1110-1111
Number of pages	2
Journal	Electronics Letters
Volume	34
Issue number	11
DOIs	https://doi.org/10.1049/el:19980787
State	Published - 28 05 1998
Externally published	Yes

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title = "Evaluation of spatial Green's functions for microstrips: Fast Hankel transform algorithm and complex image method",

abstract = "The fast Hankel transform (FHT) algorithm and complex image method (CIM) are employed to evaluate the spatial-domain Green's function for a multilayered microstrip structure. The results are compared with those obtained by exact numerical integration. It is found that both techniques have high efficiency and the FHT has better accuracy than the CIM.",

author = "Hsieh, \{Rong Chan\} and Kuo, \{Jen Tsai\}",

year = "1998",

month = may,

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doi = "10.1049/el:19980787",

language = "英语",

volume = "34",

pages = "1110--1111",

journal = "Electronics Letters",

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T1 - Evaluation of spatial Green's functions for microstrips

T2 - Fast Hankel transform algorithm and complex image method

AU - Hsieh, Rong Chan

AU - Kuo, Jen Tsai

PY - 1998/5/28

Y1 - 1998/5/28

N2 - The fast Hankel transform (FHT) algorithm and complex image method (CIM) are employed to evaluate the spatial-domain Green's function for a multilayered microstrip structure. The results are compared with those obtained by exact numerical integration. It is found that both techniques have high efficiency and the FHT has better accuracy than the CIM.

AB - The fast Hankel transform (FHT) algorithm and complex image method (CIM) are employed to evaluate the spatial-domain Green's function for a multilayered microstrip structure. The results are compared with those obtained by exact numerical integration. It is found that both techniques have high efficiency and the FHT has better accuracy than the CIM.

UR - https://www.scopus.com/pages/publications/0032070732

U2 - 10.1049/el:19980787

DO - 10.1049/el:19980787

M3 - 文献综述

AN - SCOPUS:0032070732

SN - 0013-5194

VL - 34

SP - 1110

EP - 1111

JO - Electronics Letters

JF - Electronics Letters

IS - 11

ER -

Evaluation of spatial Green's functions for microstrips: Fast Hankel transform algorithm and complex image method

Abstract

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