Abstract
Lifetime of high power LEDs as lighting source is needed for its widespread adoption, and extrapolation of lifetime from accelerated stress is needed. Current practice of extrapolation is to use TM-21 and Peck model. In this work, we show that the use of Peck model is not correct, and the use of TM-21 must be done with cautions for the temperature range and the identification of possible mixture degradation mechanisms is needed before performing the extrapolation. Extrapolation of lifetime beyond 10% degradation may not be trivial due to the change in the degradation mechanism.
| Original language | English |
|---|---|
| Title of host publication | 2014 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2014 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781479923342 |
| DOIs | |
| State | Published - 13 03 2014 |
| Externally published | Yes |
| Event | 2014 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2014 - Chengdu, China Duration: 18 06 2014 → 20 06 2014 |
Publication series
| Name | 2014 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2014 |
|---|
Conference
| Conference | 2014 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2014 |
|---|---|
| Country/Territory | China |
| City | Chengdu |
| Period | 18/06/14 → 20/06/14 |
Bibliographical note
Publisher Copyright:© 2014 IEEE.
Keywords
- Peck model
- TM-21
- activation energy
- multiple failure mechanisms
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