Fabrication and Characterization of Metal-Multiferroic (Cr- substituted BiFeO3)-Insulator (HfO2)-Silicon Structures for Non-Volatile Memory Applications

P. C. Juan; Y. W. Liu; C. H. Liu; D. C. Shye; J. H. Lu; C. L. Lin; Chia-Liang Sun

Fabrication and Characterization of Metal-Multiferroic (Cr- substituted BiFeO3)-Insulator (HfO2)-Silicon Structures for Non-Volatile Memory Applications

P. C. Juan, Y. W. Liu, C. H. Liu, D. C. Shye, J. H. Lu, C. L. Lin, Chia-Liang Sun

Department of Chemical and Materials Engineering

Research output: Contribution to conference › Proceeding

Original language	American English
State	Published - 2010
Event	The International Union of Materials Research Societies - International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010) - Seoul, Korea(South) Duration: 22 08 2010 → 27 08 2010

Conference

Conference	The International Union of Materials Research Societies - International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010)
Period	22/08/10 → 27/08/10

Cite this

Juan, P. C., Liu, Y. W., Liu, C. H., Shye, D. C., Lu, J. H., Lin, C. L., & Sun, C.-L. (2010). Fabrication and Characterization of Metal-Multiferroic (Cr- substituted BiFeO3)-Insulator (HfO2)-Silicon Structures for Non-Volatile Memory Applications. The International Union of Materials Research Societies - International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010).

@conference{e46806fe2ea7486db826df2445186acb,

title = "Fabrication and Characterization of Metal-Multiferroic (Cr- substituted BiFeO3)-Insulator (HfO2)-Silicon Structures for Non-Volatile Memory Applications",

author = "Juan, {P. C.} and Liu, {Y. W.} and Liu, {C. H.} and Shye, {D. C.} and Lu, {J. H.} and Lin, {C. L.} and Chia-Liang Sun",

year = "2010",

language = "American English",

note = "The International Union of Materials Research Societies - International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010) ; Conference date: 22-08-2010 Through 27-08-2010",

}

Juan, PC, Liu, YW, Liu, CH, Shye, DC, Lu, JH, Lin, CL & Sun, C-L 2010, 'Fabrication and Characterization of Metal-Multiferroic (Cr- substituted BiFeO3)-Insulator (HfO2)-Silicon Structures for Non-Volatile Memory Applications', The International Union of Materials Research Societies - International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010), 22/08/10 - 27/08/10.

Fabrication and Characterization of Metal-Multiferroic (Cr- substituted BiFeO3)-Insulator (HfO2)-Silicon Structures for Non-Volatile Memory Applications. / Juan, P. C.; Liu, Y. W.; Liu, C. H. et al.
2010. The International Union of Materials Research Societies - International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010).

Research output: Contribution to conference › Proceeding

TY - CONF

T1 - Fabrication and Characterization of Metal-Multiferroic (Cr- substituted BiFeO3)-Insulator (HfO2)-Silicon Structures for Non-Volatile Memory Applications

AU - Juan, P. C.

AU - Liu, Y. W.

AU - Liu, C. H.

AU - Shye, D. C.

AU - Lu, J. H.

AU - Lin, C. L.

AU - Sun, Chia-Liang

PY - 2010

Y1 - 2010

M3 - Proceeding

T2 - The International Union of Materials Research Societies - International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010)

Y2 - 22 August 2010 through 27 August 2010

ER -