Abstract
Time and frequency characterization of precision clocks and oscillators is an important task in the maintenance of time andfrequency standards. Recently, time domain signal characterization of clocks is generally preferred and several pedormance measures of clocks and oscillatorsare defined in ITU-T Recommendation G.810. Among these measures, Maximum Time Interval Error (MTIE), Time Deviation (TDEV) and Modified Allan Deviation (MDEV) are frequently used, especially in telecommunications measurement. However, the direct computation of MTIE, TDEV and MDEK defined in ITU-T Recommendation G.810, tends to be unmanageable when the number of samples becomes large. In this paper, we propose a fast computation approachfor TDEV and MDEV The approach is based on the recursive algorithm and the computation exactly conforms to the ITU-T G.810 dejinition. As compared with the direct computation approach, the time complexity of the proposed approach is reduced by a factor of N, the number of samples. It reveals that the real-time measurement or monitoring will befeasible by employing the proposed computation approach.
Original language | English |
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Title of host publication | Proceedings - International Symposium on Parallel Architectures, Algorithms, and Networks, I-SPAN 2000 |
Editors | Hal Sudborough, Burkhard Monien, D. Frank Hsu |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 156-160 |
Number of pages | 5 |
ISBN (Electronic) | 0769509363, 9780769509365 |
DOIs | |
State | Published - 2000 |
Externally published | Yes |
Event | 5th International Symposium on Parallel Architectures, Algorithms, and Networks, I-SPAN 2000 - Dallas, United States Duration: 07 12 2000 → 09 12 2000 |
Publication series
Name | Proceedings - International Symposium on Parallel Architectures, Algorithms, and Networks, I-SPAN 2000 |
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Conference
Conference | 5th International Symposium on Parallel Architectures, Algorithms, and Networks, I-SPAN 2000 |
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Country/Territory | United States |
City | Dallas |
Period | 07/12/00 → 09/12/00 |
Bibliographical note
Publisher Copyright:© 2000 IEEE.