Abstract
It is desirable to achieve both fast data access time and long data retention time simultaneously. We have developed IT PZT/40Å-Al2O3 memory to achieve very fast write (program/erase) rime <100ns, years long data retention, and good endurance > 1010 P/E cycles. The small 1T size is highly competitive with other memory technologies.
Original language | English |
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Pages | 18-19 |
Number of pages | 2 |
State | Published - 2001 |
Externally published | Yes |
Event | Device Research Conference (DRC) - Notre Dame, IN, United States Duration: 25 06 2001 → 27 06 2001 |
Conference
Conference | Device Research Conference (DRC) |
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Country/Territory | United States |
City | Notre Dame, IN |
Period | 25/06/01 → 27/06/01 |