Fast write time and long retention 1T memory

A. Chin*, M. Y. Yang, S. B. Chen, C. L. Sun, S. Y. Chen

*Corresponding author for this work

Research output: Contribution to conferenceConference Paperpeer-review

4 Scopus citations

Abstract

It is desirable to achieve both fast data access time and long data retention time simultaneously. We have developed IT PZT/40Å-Al2O3 memory to achieve very fast write (program/erase) rime <100ns, years long data retention, and good endurance > 1010 P/E cycles. The small 1T size is highly competitive with other memory technologies.

Original languageEnglish
Pages18-19
Number of pages2
StatePublished - 2001
Externally publishedYes
EventDevice Research Conference (DRC) - Notre Dame, IN, United States
Duration: 25 06 200127 06 2001

Conference

ConferenceDevice Research Conference (DRC)
Country/TerritoryUnited States
CityNotre Dame, IN
Period25/06/0127/06/01

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