@inproceedings{e6ca04cc079b4a548e9cdc1d7602ffd1,
title = "FAULT DIAGNOSIS AND SPARE ALLOCATION FOR YIELD ENHANCEMENT IN LARGE RECONFIGURABLE PLAS.",
abstract = "Yield enhancement through reconfiguration relies on accurate diagnosis of defect locations. Very little is known regarding diagnosis of the specific locations of multiple defects in logic arrays. A fault diagnosis algorithm is presented for easily testable and reconfigurable PLAs; the algorithm has the characteristics of high multiple fault coverage, low area overhead, and efficiency. Repair rules are provided to allocate reconfigurable elements in the presence of diagnosed defects.",
author = "Kuo, \{Sy Yen\} and Fuchs, \{W. Kent\}",
year = "1987",
language = "英语",
isbn = "081860798X",
series = "Digest of Papers - International Test Conference",
publisher = "IEEE",
pages = "944--951",
booktitle = "Digest of Papers - International Test Conference",
note = "Dig Pap Int Test Conf 1987, Proc, Integr of Test with Des and Manuf ; Conference date: 01-09-1987 Through 03-09-1987",
}