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Forward turn-on and reverse blocking characteristics of GaN Schottky and p-i-n rectifiers

  • A. P. Zhang*
  • , G. Dang
  • , F. Ren
  • , J. Han
  • , H. Cho
  • , S. J. Pearton
  • , J. I. Chyi
  • , T. E. Nee
  • , C. M. Lee
  • , C. C. Chuo
  • , S. N.G. Chu
  • *Corresponding author for this work
  • University of Florida
  • Sandia National Laboratories
  • National Central University
  • Nokia

Research output: Contribution to journalJournal Article peer-review

19 Scopus citations

Abstract

High voltage GaN Schottky and p-i-n rectifiers have been fabricated on heteroepitaxial layers. The Schottky diodes have reverse blocking voltages around 500 V for vertical devices employing undoped, conducting GaN, whereas these voltages are >3000 V for lateral devices employing resistive GaN. The forward turn-on voltages are ≥3.5 V for the Schottky rectifiers, with ideality factors of 1.5-2. The dominant current transport mechanism is Shockley-Read-Hall recombination. The p-i-n rectifiers fabricated with conducting i layers also have reverse blocking voltages of approximately 500 V, but the forward turn-on voltages are typically approximately 5 V. A comparison with the state-of-the-art SiC Schottky and p-i-n rectifiers is also given.

Original languageEnglish
Pages (from-to)1157-1161
Number of pages5
JournalSolid-State Electronics
Volume44
Issue number7
DOIs
StatePublished - 01 07 2000
Externally publishedYes

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