Frequency-independent coercive field in Pb(Zr0.52Ti0.48)O3 polycrystalline thin film based on sol-gel synthesis

Sankar Prasad Bag; Jim Long Her; Tung Ming Pan

doi:10.1016/j.mssp.2017.03.007

Frequency-independent coercive field in Pb(Zr_0.52Ti_0.48)O₃ polycrystalline thin film based on sol-gel synthesis

Sankar Prasad Bag, Jim Long Her, Tung Ming Pan^*

^*Corresponding author for this work

Research output: Contribution to journal › Journal Article › peer-review

2 Scopus citations

Abstract

We investigated the structural and electrical properties of Pb(Zr_0.52Ti_0.48)O₃ thin film using sol-gel spin coating method. The crystalline, structural, compositional, and morphological features of Pb(Zr_0.52Ti_0.48)O₃ film were studied by X-ray diffraction, transmission electron microscopy, energy dispersive X-ray spectroscopy, and atomic force microscopy, respectively. The relationship between the coercive field (E_c) and frequency (f) is a simple power-law, E_c(f) ∝ f^β, where β is the frequency coefficient. The β is zero in the Pb(Zr_0.52Ti_0.48)O₃ capacitor, indicating the coercive field independence of frequency. This result may be attributed to Pb(Zr_0.52Ti_0.48)O₃ thin film possessing the morphotropic phase boundary (MPB) with the coexistence of the tetragonal and rhombohedral phases. The MPB can reduce the domain wall energy to minimize the domain wall movement, and thus decreasing the resistance force acting on the domains.

Original language	English
Pages (from-to)	24-28
Number of pages	5
Journal	Materials Science in Semiconductor Processing
Volume	64
DOIs	https://doi.org/10.1016/j.mssp.2017.03.007
State	Published - 15 06 2017

Bibliographical note

Publisher Copyright:
© 2017 Elsevier Ltd

Keywords

Lead zirconate titanate
Sol-gel
Thin films

Access to Document

10.1016/j.mssp.2017.03.007

Cite this

@article{2fd9619c907a456bb047cb3483a73d17,

title = "Frequency-independent coercive field in Pb(Zr0.52Ti0.48)O3 polycrystalline thin film based on sol-gel synthesis",

abstract = "We investigated the structural and electrical properties of Pb(Zr0.52Ti0.48)O3 thin film using sol-gel spin coating method. The crystalline, structural, compositional, and morphological features of Pb(Zr0.52Ti0.48)O3 film were studied by X-ray diffraction, transmission electron microscopy, energy dispersive X-ray spectroscopy, and atomic force microscopy, respectively. The relationship between the coercive field (Ec) and frequency (f) is a simple power-law, Ec(f) ∝ fβ, where β is the frequency coefficient. The β is zero in the Pb(Zr0.52Ti0.48)O3 capacitor, indicating the coercive field independence of frequency. This result may be attributed to Pb(Zr0.52Ti0.48)O3 thin film possessing the morphotropic phase boundary (MPB) with the coexistence of the tetragonal and rhombohedral phases. The MPB can reduce the domain wall energy to minimize the domain wall movement, and thus decreasing the resistance force acting on the domains.",

keywords = "Lead zirconate titanate, Sol-gel, Thin films",

author = "\{Prasad Bag\}, Sankar and Her, \{Jim Long\} and Pan, \{Tung Ming\}",

note = "Publisher Copyright: {\textcopyright} 2017 Elsevier Ltd",

year = "2017",

month = jun,

day = "15",

doi = "10.1016/j.mssp.2017.03.007",

language = "英语",

volume = "64",

pages = "24--28",

journal = "Materials Science in Semiconductor Processing",

issn = "1369-8001",

publisher = "Elsevier Ltd",

}

TY - JOUR

T1 - Frequency-independent coercive field in Pb(Zr0.52Ti0.48)O3 polycrystalline thin film based on sol-gel synthesis

AU - Prasad Bag, Sankar

AU - Her, Jim Long

AU - Pan, Tung Ming

PY - 2017/6/15

Y1 - 2017/6/15

N2 - We investigated the structural and electrical properties of Pb(Zr0.52Ti0.48)O3 thin film using sol-gel spin coating method. The crystalline, structural, compositional, and morphological features of Pb(Zr0.52Ti0.48)O3 film were studied by X-ray diffraction, transmission electron microscopy, energy dispersive X-ray spectroscopy, and atomic force microscopy, respectively. The relationship between the coercive field (Ec) and frequency (f) is a simple power-law, Ec(f) ∝ fβ, where β is the frequency coefficient. The β is zero in the Pb(Zr0.52Ti0.48)O3 capacitor, indicating the coercive field independence of frequency. This result may be attributed to Pb(Zr0.52Ti0.48)O3 thin film possessing the morphotropic phase boundary (MPB) with the coexistence of the tetragonal and rhombohedral phases. The MPB can reduce the domain wall energy to minimize the domain wall movement, and thus decreasing the resistance force acting on the domains.

AB - We investigated the structural and electrical properties of Pb(Zr0.52Ti0.48)O3 thin film using sol-gel spin coating method. The crystalline, structural, compositional, and morphological features of Pb(Zr0.52Ti0.48)O3 film were studied by X-ray diffraction, transmission electron microscopy, energy dispersive X-ray spectroscopy, and atomic force microscopy, respectively. The relationship between the coercive field (Ec) and frequency (f) is a simple power-law, Ec(f) ∝ fβ, where β is the frequency coefficient. The β is zero in the Pb(Zr0.52Ti0.48)O3 capacitor, indicating the coercive field independence of frequency. This result may be attributed to Pb(Zr0.52Ti0.48)O3 thin film possessing the morphotropic phase boundary (MPB) with the coexistence of the tetragonal and rhombohedral phases. The MPB can reduce the domain wall energy to minimize the domain wall movement, and thus decreasing the resistance force acting on the domains.

KW - Lead zirconate titanate

KW - Sol-gel

KW - Thin films

UR - https://www.scopus.com/pages/publications/85015609491

U2 - 10.1016/j.mssp.2017.03.007

DO - 10.1016/j.mssp.2017.03.007

M3 - 文章

AN - SCOPUS:85015609491

SN - 1369-8001

VL - 64

SP - 24

EP - 28

JO - Materials Science in Semiconductor Processing

JF - Materials Science in Semiconductor Processing

ER -