Abstract
Algorithms and a software implementation of a fully automated analog layout generation program are described. Device matching, area compaction, and parasitic/noise minimization are the key concerns in the analog layout generation. A new method to incorporate integrated-circuit reliability simulation results into the performance-driven optimization step is also presented. Experimental results on operational amplifiers, voltage comparators, and voltage-controlled oscillators show that the new generation program can produce high-quality circuit layouts efficiently.
Original language | English |
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Pages | 893-896 |
Number of pages | 4 |
State | Published - 1989 |
Externally published | Yes |
Event | 4th IEEE Region 10th International Conference - TENCON '89 - Bombay, India Duration: 22 11 1989 → 24 11 1989 |
Conference
Conference | 4th IEEE Region 10th International Conference - TENCON '89 |
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City | Bombay, India |
Period | 22/11/89 → 24/11/89 |