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GaN-based stress-induced bandgap widening with various arrangements of patterned sapphire substrates

  • Vin Cent Su
  • , Po Hsun Chen
  • , Yen Pu Chen
  • , Ming Lun Lee
  • , Yao Hong You
  • , Zheng Hung Hung
  • , Ta Cheng Hsu
  • , Yu Yao Lin
  • , Ray Ming Lin
  • , Chieh Hsiung Kuan
  • National Taiwan University
  • Kingwave Corporation
  • Epistar Corporation Taiwan

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

By varying the arrangements of patterned sapphire substrates, the stress-induced bandgap widening of GaN-based epitaxial layers can be acquired. Photoluminescence and Raman results demonstrate a linear relationship of blue-shift with the increase of residual stress.

Original languageEnglish
Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580118
DOIs
StatePublished - 16 12 2016
Event2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
Duration: 05 06 201610 06 2016

Publication series

Name2016 Conference on Lasers and Electro-Optics, CLEO 2016

Conference

Conference2016 Conference on Lasers and Electro-Optics, CLEO 2016
Country/TerritoryUnited States
CitySan Jose
Period05/06/1610/06/16

Bibliographical note

Publisher Copyright:
© 2016 OSA.

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