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GaN-Based Stress-Induced Bandgap Widening with Various Arrangements of Patterned Sapphire Substrates

  • Vin Cent Su
  • , Po Hsun Chen
  • , Yen Pu Chen
  • , Ming Lun Lee
  • , Yao Hong You
  • , Zheng Hung Hung
  • , Ta Cheng Hsu
  • , Yu Yao Lin
  • , Ray Ming Lin
  • , Chieh Hsiung Kuan*
  • *Corresponding author for this work
  • National Taiwan University
  • Kingwave Corporation
  • Epistar Corporation Taiwan

Research output: Contribution to journalConference articlepeer-review

Abstract

By varying the arrangements of patterned sapphire substrates, the stress-induced bandgap widening of GaN-based epitaxial layers can be acquired. Photoluminescence and Raman results demonstrate a linear relationship of blue-shift with the increase of residual stress.

Original languageEnglish
Article numberAW1K.3
JournalOptics InfoBase Conference Papers
StatePublished - 2016
EventCLEO: Applications and Technology, CLEO AT 2016 - San Jose, United States
Duration: 05 06 201610 06 2016

Bibliographical note

Publisher Copyright:
© OSA 2016.

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