Gate capacitance effect on P-type tunnel thin-film transistor with TiN/HfZrO2 gate stack

William Cheng Yu Ma*, Ming Jhe Li, Shen Ming Luo, Jiun Hung Lin, Cai Jia Tsai

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

2 Scopus citations

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