Gate capacitance effect on P-type tunnel thin-film transistor with TiN/HfZrO2 gate stack

  • William Cheng Yu Ma*
  • , Ming Jhe Li
  • , Shen Ming Luo
  • , Jiun Hung Lin
  • , Cai Jia Tsai
    • *Corresponding author for this work

Research output: Contribution to journal › Journal Article › peer-review

2 Scopus citations

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