Gate leakage lowering and kink current suppression for antimonide-based field-effect transistors

H. K. Lin^*, Y. C. Lin, F. H. Huang, T. W. Fan, P. C. Chiu, J. I. Chyi, C. H. Ko, T. M. Kuan, M. K. Hsieh, W. C. Lee, C. H. Wann

^*Corresponding author for this work