GPU-based ATPG System by Scaling Memory Usage and Reducing Data Transfer

Hua Ren Li, Hsing Chung Liang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Test generation and fault simulation are essential in VLSI automatic test pattern generation (ATPG). Parallel computing on GPU gives another way to improve work performance. Thousands of concurrent threads can be launched simultaneously within GPU. Due to severe GPU memory limitation, scalability algorithm and efficient data transfer are necessary for test generation and fault simulation. In this paper, we present a GPU-based ATPG system that can scale memory usage and reduce data transfer between processors. We utilize several parallelism methods to enhance the system ability. Comparing to a commercial tool run with CPU in single, two, four, and eight cores, experiments show that our algorithm has 3.99, 2.18, 1.17 and 0.94 times of speedup and 0.85, 0.78, 0.76 and 0.73 times of less memory usage, respectively.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE European Test Symposium, ETS 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665418492
DOIs
StatePublished - 24 05 2021
Externally publishedYes
Event26th IEEE European Test Symposium, ETS 2021 - Virtual, Bruges, Belgium
Duration: 24 05 202128 05 2021

Publication series

NameProceedings of the European Test Workshop
Volume2021-May
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780

Conference

Conference26th IEEE European Test Symposium, ETS 2021
Country/TerritoryBelgium
CityVirtual, Bruges
Period24/05/2128/05/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

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