GROWTH AND OPTICAL CHARACTERIZATION OF CdTe THIN FILMS BY CLOSE-SPACED SUBLIMATION.

Tzu Min Hsu; Ruoh Jiun Jih; Shu Fang Fan; Pei Chi Lin; Herng Yih Ueng; Huey Liang Hwang

GROWTH AND OPTICAL CHARACTERIZATION OF CdTe THIN FILMS BY CLOSE-SPACED SUBLIMATION.

Tzu Min Hsu^*
, Ruoh Jiun Jih
, Shu Fang Fan
, Pei Chi Lin
, Herng Yih Ueng
, Huey Liang Hwang

^*Corresponding author for this work

National Central University

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

The focus has recently been on efficient CdTe/CdS thin-film solar cells in which the CdTe layers were prepared by close-spaced sublimation, and oxygen was used to control the p-type conductivity of the deposited films. Both the fundamental gap and the impurity level were determined by wavelength modulation reflectance spectroscopy, which demonstrates that oxygen atoms exhibit a local level in the forbidden band with an ionization energy about 0. 1 eV. The oxygen concentration incorporated in the CdTe thin films was found to be in the range of 10**1 **9 -10**2**0 cm** minus **3 by IR measurements, and the effect of high oxygen concentration in CdTe is discussed.

Original language	English
Pages (from-to)	846-850
Number of pages	5
Journal	Conference Record of the IEEE Photovoltaic Specialists Conference
State	Published - 1984
Externally published	Yes

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This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

Cite this

@article{fa6a57e494f64c9c84e552ac8e801743,

title = "GROWTH AND OPTICAL CHARACTERIZATION OF CdTe THIN FILMS BY CLOSE-SPACED SUBLIMATION.",

abstract = "The focus has recently been on efficient CdTe/CdS thin-film solar cells in which the CdTe layers were prepared by close-spaced sublimation, and oxygen was used to control the p-type conductivity of the deposited films. Both the fundamental gap and the impurity level were determined by wavelength modulation reflectance spectroscopy, which demonstrates that oxygen atoms exhibit a local level in the forbidden band with an ionization energy about 0. 1 eV. The oxygen concentration incorporated in the CdTe thin films was found to be in the range of 10**1 **9 -10**2**0 cm** minus **3 by IR measurements, and the effect of high oxygen concentration in CdTe is discussed.",

author = "Hsu, \{Tzu Min\} and Jih, \{Ruoh Jiun\} and Fan, \{Shu Fang\} and Lin, \{Pei Chi\} and Ueng, \{Herng Yih\} and Hwang, \{Huey Liang\}",

year = "1984",

language = "英语",

pages = "846--850",

journal = "Conference Record of the IEEE Photovoltaic Specialists Conference",

issn = "0160-8371",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - GROWTH AND OPTICAL CHARACTERIZATION OF CdTe THIN FILMS BY CLOSE-SPACED SUBLIMATION.

AU - Hsu, Tzu Min

AU - Jih, Ruoh Jiun

AU - Fan, Shu Fang

AU - Lin, Pei Chi

AU - Ueng, Herng Yih

AU - Hwang, Huey Liang

PY - 1984

Y1 - 1984

N2 - The focus has recently been on efficient CdTe/CdS thin-film solar cells in which the CdTe layers were prepared by close-spaced sublimation, and oxygen was used to control the p-type conductivity of the deposited films. Both the fundamental gap and the impurity level were determined by wavelength modulation reflectance spectroscopy, which demonstrates that oxygen atoms exhibit a local level in the forbidden band with an ionization energy about 0. 1 eV. The oxygen concentration incorporated in the CdTe thin films was found to be in the range of 10**1 **9 -10**2**0 cm** minus **3 by IR measurements, and the effect of high oxygen concentration in CdTe is discussed.

AB - The focus has recently been on efficient CdTe/CdS thin-film solar cells in which the CdTe layers were prepared by close-spaced sublimation, and oxygen was used to control the p-type conductivity of the deposited films. Both the fundamental gap and the impurity level were determined by wavelength modulation reflectance spectroscopy, which demonstrates that oxygen atoms exhibit a local level in the forbidden band with an ionization energy about 0. 1 eV. The oxygen concentration incorporated in the CdTe thin films was found to be in the range of 10**1 **9 -10**2**0 cm** minus **3 by IR measurements, and the effect of high oxygen concentration in CdTe is discussed.

UR - https://www.scopus.com/pages/publications/0021642764

M3 - 会议文章

AN - SCOPUS:0021642764

SN - 0160-8371

SP - 846

EP - 850

JO - Conference Record of the IEEE Photovoltaic Specialists Conference

JF - Conference Record of the IEEE Photovoltaic Specialists Conference

ER -

GROWTH AND OPTICAL CHARACTERIZATION OF CdTe THIN FILMS BY CLOSE-SPACED SUBLIMATION.

Abstract

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