Handling Nondeterminism in Logic Simulation so That Your Waveform Can Be Trusted Again

Kai Hui Chang; Hong Zu Chou; Haiqian Yu; Dylan Dobbyn; Sy Yen Kuo

doi:10.1109/MDT.2011.75

Handling Nondeterminism in Logic Simulation so That Your Waveform Can Be Trusted Again

Kai Hui Chang, Hong Zu Chou, Haiqian Yu, Dylan Dobbyn, Sy Yen Kuo

Research output: Contribution to journal › Journal Article › peer-review

2 Scopus citations

Abstract

This article addresses the problem of nondeterminism due to design optimization such as resetting only parts of the design register. Since formal methods are not scalable, the authors developed a scalable X-analysis method.

Original language	English
Article number	5936050
Pages (from-to)	63-71
Number of pages	9
Journal	IEEE Design and Test
Volume	33
Issue number	6
DOIs	https://doi.org/10.1109/MDT.2011.75
State	Published - 12 2016
Externally published	Yes

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

Keywords

and Fault-Tolerance
B Hardware
B.1.3 Control Structure Reliability
B.1.3.a Diagnostics
B.1.3.b Error-checking
B.1.3.c Redundant design
B.1.3.d Test generation
B.1.4.e Verification
B.2.2.a Simulation
B.2.2.b Verification
B.2.3 Reliability
B.4.5.f Test generation
B.5.2.e Verification
B.6.2 Reliability and Testing
B.6.3.d Simulation
B.6.3.f Verification
Testing

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10.1109/MDT.2011.75

Cite this

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title = "Handling Nondeterminism in Logic Simulation so That Your Waveform Can Be Trusted Again",

abstract = "This article addresses the problem of nondeterminism due to design optimization such as resetting only parts of the design register. Since formal methods are not scalable, the authors developed a scalable X-analysis method.",

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author = "Chang, {Kai Hui} and Chou, {Hong Zu} and Haiqian Yu and Dylan Dobbyn and Kuo, {Sy Yen}",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.",

year = "2016",

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doi = "10.1109/MDT.2011.75",

language = "英语",

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AU - Dobbyn, Dylan

AU - Kuo, Sy Yen

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KW - B.4.5.f Test generation

KW - B.5.2.e Verification

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Handling Nondeterminism in Logic Simulation so That Your Waveform Can Be Trusted Again

Abstract

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