High-frequency performance of metamorphic InP/In0.53Ga0.47As/InP DHBT in common base configuration on GaAs substrates

Yong Zhong Xiong*, Jeffrey S. Fu, Hong Wang, Geok Ing Ng, K. Radhakrishnan

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

Abstract

In this work, we report the detailed high-frequency noise and power characterization of metamorphic InP double heterojunction bipolar transistors in common base configuration. The noise and power performances were investigated for 5 × 10 μm2 device. A minimum noise figure of 2.3 dB with an associated gain of 14.5 dB at 2 GHz, and a maximum output power of 13.0 dBm with a power added efficiency of 47.8% at 2.4 GHz were obtained.

Original languageEnglish
Pages (from-to)647-649
Number of pages3
JournalMaterials Science in Semiconductor Processing
Volume4
Issue number6
DOIs
StatePublished - 12 2001
Externally publishedYes

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