Abstract
The high-k Tb2O3 poly-Si TFT device using a 20 W plasma power treatment exhibited good electrical performances, including a high effective carrier mobility, a low-threshold voltage, a small subthreshold slope, and a high ION/IOFF current ratio. It also enhanced electrical reliabilities including hot carrier and positive bias temperature instability.
Original language | English |
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Pages | 783-784 |
Number of pages | 2 |
State | Published - 2010 |
Event | 17th International Display Workshops, IDW'10 - Fukuoka, Japan Duration: 01 12 2010 → 03 12 2010 |
Conference
Conference | 17th International Display Workshops, IDW'10 |
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Country/Territory | Japan |
City | Fukuoka |
Period | 01/12/10 → 03/12/10 |