Abstract
The high-k Tb2O3 poly-Si TFT device using a 20 W plasma power treatment exhibited good electrical performances, including a high effective carrier mobility, a low-threshold voltage, a small subthreshold slope, and a high ION/IOFF current ratio. It also enhanced electrical reliabilities including hot carrier and positive bias temperature instability.
| Original language | English |
|---|---|
| Pages | 783-784 |
| Number of pages | 2 |
| State | Published - 2010 |
| Event | 17th International Display Workshops, IDW'10 - Fukuoka, Japan Duration: 01 12 2010 → 03 12 2010 |
Conference
| Conference | 17th International Display Workshops, IDW'10 |
|---|---|
| Country/Territory | Japan |
| City | Fukuoka |
| Period | 01/12/10 → 03/12/10 |
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