High pressure induced phase transition in sulfur doped indium phosphide: An angular-dispersive X-ray diffraction and Raman study

Chih Ming Lin*, Hwo Shuenn Sheu, Min Hsiung Tsai, Bi Ru Wu, Sheng Rui Jian

*Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

17 Scopus citations

Abstract

The high pressure induced phase transitions in sulfur doped indium phosphide (InP:S) at ambient temperature has been investigated using angular-dispersive X-ray diffraction (ADXRD) and Raman scattering under high pressure up to around 44.6 and 37.4 GPa, respectively. In situ ADXRD measurements found that the transition of InP:S to a rock-salt phase began at 10.4 GPa and completed at 13.3 GPa with a 15.7% volume decrease. Another transition to the orthorhombic structure with space group Cmcm (the Cmcm phase) was found to occur at 35.8 GPa with a 4.1% volume decrease. The fitting of volume compression data to the third-order Birch-Murnaghan equation of state yielded that the zero-pressure isothermal bulk moduli (B0) and the first-pressure derivatives (B0) were 74 GPa and 3.9 for the zinc-blende phase, respectively. The rock-salt to Cmcm phase transition pressure increases relative to that of undoped InP of 32 GPa, which may be attributable to the increase of the ionicity of InP:S by S doping favorable to the ionic rock salt structure. In situ Raman measurements have similar findings.

Original languageEnglish
Pages (from-to)136-141
Number of pages6
JournalSolid State Communications
Volume149
Issue number3-4
DOIs
StatePublished - 01 2009

Keywords

  • A. Sulfur doped indium phosphide
  • E. Angular-dispersive X-ray diffraction
  • E. High pressure

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