High-speed charge transfer sense amplifier for 0.5 v DRAM array applications

  • Hwang Cherng Chow*
  • , Chaung Lin Hsieh
  • *Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

3 Scopus citations

Abstract

A new high-speed charge transfer sense amplifier scheme is proposed for 0.5V DRAM array applications. The combination of both the cross-coupled structure and the boosting capacitance used in the proposed sense amplifier leads to a maximum voltage difference between sense nodes. Based on post-layout simulations, the charge transfer speed and the voltage difference after charge transfer are improved 40.7% and 59.29%, respectively, over the prior art circuits. The power-delay product is then enhanced 38.26%. Besides, both high voltage pre-charge levels and high voltage control signals are not required in this proposed circuit as compared with prior arts.

Original languageEnglish
Pages (from-to)165-171
Number of pages7
JournalInternational Journal of Electronics
Volume96
Issue number2
DOIs
StatePublished - 02 2009

Keywords

  • Boosting capacitance
  • Charge transfer
  • DRAM
  • Low voltage
  • Sense amplifier

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