High thermal dissipation of normally off p-GaN gate AlGaN/GaN HEMTs on 6-inch N-doped low-resistivity SiC substrate

  • Yu Chun Huang
  • , Hsien Chin Chiu*
  • , Hsuan Ling Kao
  • , Hsiang Chun Wang
  • , Chia Hao Liu
  • , Chong Rong Huang
  • , Si Wen Chen
  • *Corresponding author for this work

Research output: Contribution to journalJournal Article peer-review

9 Scopus citations

Abstract

Efficient heat removal through the substrate is required in high-power operation of Al- GaN/GaN high-electron-mobility transistors (HEMTs). Thus, a SiC substrate was used due to its popularity. This article reports the electrical characteristics of normally off p-GaN gate AlGaN/GaN high-electron-mobility transistors (HEMTs) on a low-resistivity SiC substrate compared with the traditional Si substrate. The p-GaN HEMTs on the SiC substrate possess several advantages, including electrical characteristics and good qualities of epitaxial crystals, especially on temperature performance. Additionally, the price of the low-resistivity SiC substrate is three times lower than the ordinary SiC substrate.

Original languageEnglish
Article number509
JournalMicromachines
Volume12
Issue number5
DOIs
StatePublished - 2021

Bibliographical note

Publisher Copyright:
© 2021 by the authors. Licensee MDPI, Basel, Switzerland.

Keywords

  • Low-resistance SiC substrate
  • Normally off
  • P-GaN gate HEMT
  • Temperature

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