Abstract
Efficient heat removal through the substrate is required in high-power operation of Al- GaN/GaN high-electron-mobility transistors (HEMTs). Thus, a SiC substrate was used due to its popularity. This article reports the electrical characteristics of normally off p-GaN gate AlGaN/GaN high-electron-mobility transistors (HEMTs) on a low-resistivity SiC substrate compared with the traditional Si substrate. The p-GaN HEMTs on the SiC substrate possess several advantages, including electrical characteristics and good qualities of epitaxial crystals, especially on temperature performance. Additionally, the price of the low-resistivity SiC substrate is three times lower than the ordinary SiC substrate.
| Original language | English |
|---|---|
| Article number | 509 |
| Journal | Micromachines |
| Volume | 12 |
| Issue number | 5 |
| DOIs | |
| State | Published - 2021 |
Bibliographical note
Publisher Copyright:© 2021 by the authors. Licensee MDPI, Basel, Switzerland.
Keywords
- Low-resistance SiC substrate
- Normally off
- P-GaN gate HEMT
- Temperature
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