Hot-Carrier Effect and Negative Bias Temperature Instability of Narrow-Width pMOSFET's

楊明正

Research output: Types of ThesisMaster's thesis

Translated title of the contribution窄寬度p型場效應電晶體之熱載子效應及負偏壓溫度不穩定性
Original languageAmerican English
Supervisors/Advisors
  • Lai, Chao-Sung, Supervisor
  • Yang, Jun-Zhe, Supervisor
StatePublished - 2003
Externally publishedYes

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