Identifying Untestable Faults in Sequential Circuits

Hsing Chung Liang, Chung Len Lee, Jwu E. Chen

Research output: Contribution to journal › Journal Article › peer-review

26 Scopus citations

Original language	English
Pages (from-to)	14-23
Number of pages	10
Journal	IEEE Design and Test of Computers
Volume	12
Issue number	3
DOIs	https://doi.org/10.1109/MDT.1995.466367
State	Published - 1995
Externally published	Yes

Access to Document

@article{395c66190d904143b3e817ed932aed9c,

title = "Identifying Untestable Faults in Sequential Circuits",

author = "Liang, {Hsing Chung} and Lee, {Chung Len} and Chen, {Jwu E.}",

year = "1995",

doi = "10.1109/MDT.1995.466367",

language = "英语",

volume = "12",

pages = "14--23",

journal = "IEEE Design and Test of Computers",

issn = "0740-7475",

publisher = "IEEE Computer Society",

number = "3",

}

TY - JOUR

T1 - Identifying Untestable Faults in Sequential Circuits

AU - Liang, Hsing Chung

AU - Lee, Chung Len

AU - Chen, Jwu E.

PY - 1995

Y1 - 1995

UR - http://www.scopus.com/inward/record.url?scp=0029379370&partnerID=8YFLogxK

U2 - 10.1109/MDT.1995.466367

DO - 10.1109/MDT.1995.466367

M3 - 文章

AN - SCOPUS:0029379370

SN - 0740-7475

VL - 12

SP - 14

EP - 23

JO - IEEE Design and Test of Computers

JF - IEEE Design and Test of Computers

IS - 3

ER -