Identifying Untestable Faults in Sequential Circuits

Hsing Chung Liang, Chung Len Lee, Jwu E. Chen

Research output: Contribution to journal › Journal Article › peer-review

26 Scopus citations

Original language	English
Pages (from-to)	14-23
Number of pages	10
Journal	IEEE Design and Test of Computers
Volume	12
Issue number	3
DOIs	https://doi.org/10.1109/MDT.1995.466367
State	Published - 1995
Externally published	Yes

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title = "Identifying Untestable Faults in Sequential Circuits",

author = "Liang, \{Hsing Chung\} and Lee, \{Chung Len\} and Chen, \{Jwu E.\}",

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AU - Lee, Chung Len

AU - Chen, Jwu E.

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